High-resolution XRD pattern of the ng26 layer with a thickness of 3.4... | Download Scientific Diagram
PDF) Spectral interferometry and reflectometry used to measure thin films
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electronic reprint High-resolution synchrotron diffraction study of porous buffer InP(001) layers
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Left: same map as in Fig. 2 but with the contours of the logarithm of... | Download Scientific Diagram
Study area in Central Europe, including the Czech Republic and northern... | Download Scientific Diagram
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2 - Československá mikroskopická společnost
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